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Passivation effect on gate-bias stress instability of carbon nanotube thin film transistors

Lee, SW[Lee, Sang Won]; Suh, D[Suh, Dongseok]; Lee, SY[Lee, Si Young]; Lee, YH[Lee, Young Hee]

ArticleIssue Date2014CitationAPPLIED PHYSICS LETTERS, v.104, no.16PublisherAMER INST PHYSICS

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(03063) 25-2, SUNGKYUNKWAN-RO, JONGNO-GU, SEOUL, KOREA samsunglib@skku.edu

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