Seo, MK[Seo, Mu-Kyung]; Hwang, YI[Hwang, Young-in]; Kim, G[Kim, Geonwoo]; Kwon, S[Kwon, Segon]; Kim, HJ[Kim, Hak-Joon]; Ha, TH[Ha, Tae-Hoon]; Baek, KS[Baek, Kwagn sae]; Kim, KB[Kim, Ki-Bok]
ArticleIssue Date2021CitationJOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING, v.41, no.1, pp.59 - 66PublisherKOREAN SOC NONDESTRUCTIVE TESTING