Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments

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초록

Solid-State Drive (SSD) firmware manages complex internal states, including flash memory maintenance. Due to nondeterministic I/O operations, traditional testing methods struggle to rapidly achieve coverage of firmware code areas that require extensive I/O accumulation. To address this challenge, we propose a state data-aware fuzzing approach that leverages SSD firmware's internal state to guide input generation under nondeterministic I/O conditions and accelerate coverage discovery. Our experiments with an open-source SSD firmware emulator show that the proposed method achieves the same firmware test coverage as a state-of-the-art coverage-based fuzzer (AFL++) while requiring approximately 67% fewer commands, without reducing the number of crashes or hangs detected. Moreover, we extend our experiments by incorporating various I/O commands beyond basic write/read operations to reflect real user scenarios, and we confirm that our strategy remains effective even for multiple types of I/O tests. We further validate the effectiveness of state data-aware fuzzing for firmware testing under I/O environments and suggest that this approach can be extended to other storage firmware or threshold-based embedded systems in the future.

키워드

Coverage-Based Testing; Fuzzing; Nondeterministic I/O; SSD Firmware; Threshold
제목
Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments
저자
Yoon, Gangho; Lee, Eunseok
DOI
10.1145/3756681.3757033
발행일
2025
유형
Proceedings Paper
저널명
Proceedings of the 29th International Conference on Evaluation and Assessment in Software Engineering , EASE, 2025 edition, EASE 2025
페이지
739 ~ 744