상세 보기
p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistor-Based Scan Driver Circuit Capable of Positive and Negative Dual Output Signals
- Woo, Hye-Won;
- Na, Se-Hwan;
- Kim, Jung-Chul;
- Yoo, Juhn-Suk;
- Moon, Kook Chul;
- ... Kim, Yong-Sang;
- 외 1명
Citations
WEB OF SCIENCE
0Citations
SCOPUS
0초록
We propose a scan driver circuit based on p-type low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) capable of positive and negative dual output (PNDO) signals, enabling to activate n-type and p-type TFTs in LTPS and oxide TFT-based pixel circuits. The proposed circuit outputs PNDOs with improved falling characteristics by controlling the output timing and using a bootstrapping method. Power consumption and the circuit area are reduced by generating PNDO signals using a single control part. In addition, the fabricated circuit successfully generated PNDO signals.
키워드
Driver circuits; Power demand; Thin film transistors; Logic gates; Turning; Threshold voltage; Silicon; Gate drivers; Clocks; Timing; Positive and negative dual output (PNDO); power consumption; p-type low-temperature polycrystalline silicon (LTPS); scan driver circuit; thin-film transistor (TFT)
- 제목
- p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistor-Based Scan Driver Circuit Capable of Positive and Negative Dual Output Signals
- 저자
- Woo, Hye-Won; Na, Se-Hwan; Kim, Jung-Chul; Yoo, Juhn-Suk; Moon, Kook Chul; Im, Hwarim; Kim, Yong-Sang
- 발행일
- 2025-11
- 유형
- Article; Early Access
- 권
- 73
- 호
- 1
- 페이지
- 427 ~ 432