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최병덕
CHOI, BYOUNG DEOG
정보통신대학
전자전기공학부
연구분야
- Characterization of MOS Capacitor, and MOSFET with I-V, Generation and Recombination lifetime, and C-f Dependence,
- Characterization of MOS Capacitor, and MOSFET with I-V, Generation and Recombination lifetime, and C-f Dependence,
- Device Reliability of Advanced CMOS Technologies,
- Device Reliability of Advanced CMOS Technologies,
- Flash Memory Technology,
- Flash Memory Technology
자료 필터
자료유형
발행연도
2008 ~ 2026
2008 2026
키워드
언어
전체 164건 중 1번부터 10번까지의 결과를 표시합니다.
2026
Article
Overcoming DRAM BCAT patterning defects by reducing bending and wiggling
- Huh, Donggyu ;
- Choi, Byoungdeog
- 2026
- Proceedings of SPIE - The International Society for Optical Engineering
- SPIE
2025
Article
Hydrogen and oxygen induced abnormal reliability degradation in flexible top-gate amorphous In-Ga-Zn-O thin-film transistors under negative bias thermal illumination stress
- Kim, Dongbhin ;
- Lee, Kyeong-Bae ;
- Choi, Byoungdeog
- 2025-12
- Microelectronics
- Elsevier Ltd
Article
High On/Off ratio and robust photo-stability by interstitial composition in a-IGTO/TiOx TFT
- Kim, Moonsoo ;
- Lee, Hwan-gyu ;
- Cho, Junehyeong ;
- Lee, Kyeong-Bae ;
- Choi, Byoungdeog
- 2025-11-15
- Applied Surface Science
- Elsevier B.V.
Article
Impact of lithium fluoride buffer layer on contact interface engineering in a–IGZO TFTs
- Kim, Donghyun ;
- Park, Hyunsoo ;
- Kim, Moonsoo ;
- Kim, Dongbhin ;
- Lee, Kyeong-Bae ;
- ... Choi, Byoungdeog ;
- 외 1명
- 2025-11
- Current Applied Physics
- Elsevier B.V.
Article
Threshold shift mechanism in fluorine-doped indium-gallium-zinc-oxide thin film transistors via defect analysis
- Jung, Moonil ;
- Yang, Jeeeun ;
- Yun, Dong-Jin ;
- Heo, Sung ;
- Kim, Sangwook ;
- ... Choi, Byoungdeog
- 2025-11
- Current Applied Physics
- Elsevier B.V.
Article
Improving Hot-Electron-Induced Punch-Through Immunity Through a Dual Shallow Trench Isolation Oxide Process
- Jeon, Jaehyeon ;
- Kim, Sangkwan ;
- Lee, Sungsam ;
- Choi, Byoungdeog
- 2025-10
- IEEE Transactions on Electron Devices
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Approach to reducing oversaturated boron content in plate poly layer of DRAM
- Park, Dong-Sik ;
- Park, Joonsuk ;
- Cho, Ha-Na ;
- Jang, Hyeon-Woo ;
- Shin, Su-Ho ;
- ... Choi, Byoungdeog
- 2025-10
- Materials Science in Semiconductor Processing
- ELSEVIER SCI LTD
Article
Trade-Off between Thermally Induced Crystallization and Oxide Integrity for DRAM Application
- Kim, Moonsoo ;
- Cho, Junehyeong ;
- Lee, Kyeong-Bae ;
- Lee, Hwan-gyu ;
- Noh, Junho ;
- ... Choi, Byoungdeog ;
- 외 1명
- 2025-08-19
- ACS OMEGA
- AMER CHEMICAL SOC
Article
RbNO3 Wet Chemical Treatment for Contact Engineering and Enhanced Performance of a-IGTO TFTs with Improved Stability
- Lee, Kyeong-Bae ;
- Cho, Junehyeong ;
- Kim, Dongbhin ;
- Jung, Sungwoo ;
- Kim, Moonsoo ;
- ... Choi, Byoungdeog ;
- 외 3명
- 2025-08-13
- ACS Applied Materials and Interfaces
- AMER CHEMICAL SOC
Article
Impact of proton-beam irradiation on the electrical reliability and performance of LTPS and a-IGZO thin-film transistors
- Noh, Junho ;
- Kim, Moonsoo ;
- Kim, Dongbhin ;
- Park, Sungsoo ;
- Lee, Hwan-gyu ;
- ... Choi, Byoungdeog ;
- 외 3명
- 2025-07-01
- Scientific Reports
- NATURE PORTFOLIO
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