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최병덕
CHOI, BYOUNG DEOG
정보통신대학
전자전기공학부
연구분야
- Characterization of MOS Capacitor, and MOSFET with I-V, Generation and Recombination lifetime, and C-f Dependence,
- Characterization of MOS Capacitor, and MOSFET with I-V, Generation and Recombination lifetime, and C-f Dependence,
- Device Reliability of Advanced CMOS Technologies,
- Device Reliability of Advanced CMOS Technologies,
- Flash Memory Technology,
- Flash Memory Technology
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